Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)

Efficient Image Segmentation for Detection of Dislocations in High Resolution Light Microscope Images of SiC Wafers (2011) Karpinski H, Sakwe A, Fried MJ, Bänsch E, Wellmann P Journal article, Original article Kooperative Promotionen mit Fachhochschulen in Zusammenarbeit mit der technischen Fakultät der Universität Erlangen-Nürnberg; erschienen in „Ingenieurpromotion – Stärken und Qualitätssicherung, Beiträge eines gemeinsamen Symposiums von acatech, TU9, ARGE TU/TH und 4ing (2011) Wellmann P Book chapter / Article in edited volumes From Semiconductors to New Energy – the PV Value added Chain, Proceedings of the E-MRS ICAM IUMRS 2011 Spring Meeting (2011) Richter H, Wellmann P Edited Volume Generation of void-like structures during hot-hydrogen etching of Si substrates for 3C-SiC epitaxy (2011) Hens P, Mueller J, Fahlbusch L, Spiecker E, Wellmann P, Spiecker E Journal article, Original article Differential calorimetry study of the initial stage of the sulphurisation process of CuInSe2 solar cell materials (2010) Tang K, Künecke U, Oehlschläger F, Hölzing A, Schurr R, Hock R, Wellmann P Journal article Conductivity and adhesion enhancement in low-temperature processed indium tin oxide/polymer nanocomposites (2010) Maksimenko I, Groß M, Königer T, Münstedt H, Wellmann P Journal article Determination of material inhomogeneities in CuIn(Se,S)(2) solar cell materials by high resolution cathodoluminescence topography (2010) Oehlschläger F, Müller J, Künecke U, Hoelzing A, Schurr R, Hock R, Wellmann P Journal article, Original article Real-Time Investigations on the Formation of CuIn(S,Se)(2) While Annealing Precursors With Varying Sulfur Content (2010) Hölzing A, Schurr R, Jost S, Palm J, Deseler K, Hock R, Wellmann P Journal article, Original article Fundamental study of the temperature ramp-up influence for 3C-SiC hetero-epitaxy on silicon (100) (2010) Hens P, Wagner G, Hölzing A, Hock R, Wellmann P Journal article, Original article Observation of lattice plane bending during SiC PVT bulk growth using in-situ high energy x-ray diffraction (2010) Hock R, Konias K, Perdicaro LMS, Magerl A, Hens P, Wellmann P Journal article, Original article