Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)

Novel Photonic Applications of Silicon Carbide (2023) Ou H, Shi X, Lu Y, Kollmuß M, Steiner J, Tabouret V, Syväjärvi M, et al. Journal article, Review article Automated analysis of X-ray topography of 4H-SiC wafers: Image analysis, numerical computations, and artificial intelligence approaches for locating and characterizing screw dislocations (2023) Nguyen BD, Roder M, Danilewsky A, Steiner J, Wellmann P, Sandfeld S Journal article In Situ Monitoring of the Ambient Gas Phase during PVT Growth of Nominally Undoped High Resistivity SiC Boules (2023) Ihle J, Wellmann P Book chapter / Article in edited volumes Transfer of Heteroepitaxial Grown 3C-SiC Layers for Application in Optical Frequency Combs (2023) Kollmuß M, Shi X, Ou H, Wellmann P Book chapter / Article in edited volumes Prevention of Bunched Basal Plane Dislocation Arrays in 4H-SiC PVT-Growth (2023) Steiner J, Nguyen BD, Sandfeld S, Wellmann P Book chapter / Article in edited volumes Investigation of the Nucleation Process During the Initial Stage of PVT Growth of 4H-SiC (2023) Strüber S, Arzig M, Steiner J, Salamon M, Uhlmann N, Wellmann P Book chapter / Article in edited volumes Effect of Growth Conditions on the Surface Morphology and Defect Density of CS-PVT-Grown 3C-SiC (2023) Kollmuß M, La Via F, Wellmann P Journal article In situ bow reduction during sublimation growth of cubic silicon carbide (2022) Kollmuß M, Mauceri M, Roder M, La Via F, Wellmann P Journal article Multiscale Simulations for Defect-Controlled Processing of Group IV Materials (2022) Calogero G, Deretzis I, Fisicaro G, Kollmuß M, La Via F, Lombardo SF, Schöler M, et al. Journal article Fabrication of Bariumtrisulphide Thin Films as Precursors for Chalcogenide Perovskites (2022) Freund T, Cicconi MR, Wellmann P Journal article