Siemens AG

Industry / private company


Location: München, Erlangen, Nürnberg, Germany (DE) DE

ISNI: 000000012178835X

ROR: https://ror.org/059mq0909

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

A Human-Machine Distance Control System Using Incoherent Cooperative FMCW Radar Sensors (2021) Edstaller S, Mueller D Conference contribution Modelling and challenges of integration of large renewable power plants (2021) Kuri A, Audring D Conference contribution, Conference Contribution Security assessment for higher loaded power system operation to 2030 (2021) Raab A, Mehlmann G, Schindler J, Luther M, Abel M, Horn S, Heyde C, et al. Conference contribution X-ray Scatter Estimation Using Deep Splines (2021) Roser P, Birkhold A, Preuhs A, Syben-Leisner C, Felsner L, Hoppe E, Strobel N, et al. Journal article Deep Learning Compatible Differentiable X-ray Projections for Inverse Rendering (2021) Shetty K, Birkhold A, Strobel N, Egger B, Jaganathan S, Kowarschik M, Maier A Conference contribution Abstract: Simultaneous Estimation of X-ray Back-scatter and Forward-scatter using Multi-task Learning (2021) Roser P, Zhong X, Birkhold A, Preuhs A, Syben-Leisner C, Hoppe E, Strobel N, et al. Conference contribution Move Over There One-click Deformation Correction for Image Fusion during Endovascular Aortic Repair (2021) Breininger K, Pfister M, Kowarschik M, Maier A Conference contribution Estimation of statistical weights for model-based iterative ct reconstruction (2021) Haase V, Stierstorfer K, Hahn K, Schöndube H, Maier A, Noo F Conference contribution A novel Grid Forming Control Scheme revealing a True Inertia Principle (2021) Kuri A, Zurowski R, Mehlmann G, Audring D, Luther M Journal article, Original article Enhanced X-Ray Inspection of Solder Joints in SMT Electronics Production using Convolutional Neural Networks (2020) Schmidt K, Thielen N, Voigt C, Seidel R, Franke J, Milde Y, Bonig J, Beitinger G Conference contribution