Eindhoven University of Technology / Technische Universiteit Eindhoven (TU/e)

University / College


Location: Eindhoven, Netherlands (NL) NL

ISNI: 0000000403988763

ROR: https://ror.org/02c2kyt77

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

A computer-assisted algorithm for narrow-band imaging-based tissue characterization in Barrett's esophagus (2021) Struyvenberg MR, de Groof AJ, van der Putten J, van der Sommen F, Baldaque-Silva F, Omae M, Pouw R, et al. Journal article Capillary interactions between soft capsules protruding through thin fluid films (2020) Wouters M, Aouane O, Sega M, Harting J Journal article, Original article Equilibrium Orientation and Adsorption of an Ellipsoidal Janus Particle at a Fluid-Fluid Interface (2020) Gunther F, Xie Q, Harting J Journal article Cross-scanner and cross-protocol multi-shell diffusion MRI data harmonization: Algorithms and results (2020) Ning L, Bonet-Carne E, Grussu F, Sepehrband F, Kaden E, Veraart J, Blumberg SB, et al. Journal article Desorption energy of soft particles from a fluid interface (2020) Mehrabian H, Snoeijer JH, Harting J Journal article Multi-modal sensor fusion for highly accurate vehicle motion state estimation (2020) Marco VR, Kalkkuhl J, Raisch J, Scholte WJ, Nijmeijer H, Seel T Journal article Self-Similar Liquid Lens Coalescence (2020) Hack MA, Tewes W, Xie Q, Datt C, Harth K, Harting J, Snoeijer JH Journal article Towards a Hexagonal SiGe Semiconductor Laser (2020) Tilburg MA, Dijkstra A, Fadaly EM, Lange VT, Verheijen MA, Suckert JR, Rodl C, et al. Conference contribution Transition Matrix Element and Recombination Mechanism of Hexagonal SiGe (2020) DIjkstra A, Tilburg MA, Fadaly EM, Lange VT, Verheijen MA, Suckert JR, Rodl C, et al. Conference contribution Direct-bandgap emission from hexagonal Ge and SiGe alloys (2020) Fadaly EMT, Dijkstra A, Suckert JR, Ziss D, Van Tilburg MAJ, Mao C, Ren Y, et al. Journal article