NaMLab gGmbH

Industry / private company


Location: Dresden, Germany (DE) DE

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Analysis of the effect of germanium preamorphization on interface defects and leakage current for high-k metal-oxide-semiconductor field-effect transistor (2011) Roll G, Jakschik S, Goldbach M, Wachowiak A, Mikolajick T, Frey L Journal article, Original article Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation (2011) Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L Journal article, Original article Ferroelectric Zr0.5Hf0.5O2 thin films for nonvolatile memory applications (2011) Mueller J, Boescke TS, Braeuhaus D, Schroeder U, Boettger U, Sundqvist J, Kuecher P, et al. Journal article, Original article Platinum contamination issues in ferroelectric memories (2002) Boubekeur H, Mikolajick T, Pamler W, Höpfner J, Frey L, Ryssel H Journal article, Original article Effect of barium contamination on gate oxide integrity in high-k dram (2002) Boubekeur H, Mikolajick T, Bauer A, Frey L, Ryssel H Journal article, Original article Barium, strontium and bismuth contamination in CMOS processes (2001) Boubekeur H, Mikolajick T, Höpfner J, Dehm C, Pamler W, Steiner J, Kilian G, et al. Authored book, Volume of book series
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