Prof. Dr. Lothar Frey

Lehrstuhl für Elektronische Bauelemente

Silicon nitride, a high potential dielectric for 600 v integrated RC-snubber applications (2015) Krach F, Schwarzmann H, Bauer A, Erlbacher T, Frey L Journal article, Original article Charge pumping measurements on differently passivated lateral 4H-SiC MOSFETs (2015) Salinaro A, Pobegen G, Aichinger T, Zippelius B, Peters DP, Friedrichs P, Frey L Journal article, Original article Bragg gratings in imprinted Ormocer® waveguides (2015) Girschikofsky MG, Förthner M, Rommel M, Frey L, Hellmann R Conference contribution, Conference Contribution SiC MOSFETs in hard-switching bidirectional DC/DC converters (2015) Heckel T, Eckhardt B, März M, Frey L, Heckel T Authored book, Volume of book series Influence of annealing, oxidation and doping on conduction-band near interface traps in 4H-SiC characterized by low temperature conductance measurements (2015) Noll S, Rambach M, Grieb M, Scholten D, Bauer A, Frey L Authored book, Volume of book series Modeling of ion drift in 4H-SiC-based chemical MOSFET sensors (2015) Erlbacher T, Schwarzmann H, Bauer AJ, Doehler GH, Schreivogel M, Lutz T, Guillen FH, et al. Journal article Comparison of silicon and 4H silicon carbide patterning using focused ion beams (2015) Kaliya Perumal Veerapandian S, Beuer S, Rumler M, Stumpf F, Thomas K, Pillatsch L, Michler J, et al. Journal article Impact of post-trench processing on the electrical characteristics of 4H-SiC trench-MOS structures with thick top and bottom oxides (2015) Banzhaf C, Grieb M, Rambach M, Bauer A, Frey L Authored book, Volume of book series Current conduction mechanism of MIS devices using multidimensional minimization system program (2015) Rouag, N, Ouennoughi Z, Rommel M, Murakami K, Frey L Journal article, Original article Assessment of dicing induced damage and residual stress on the mechanical and electrical behavior of chips (2015) Fügl M, Mackh G, Meissner E, Frey L Conference contribution, Conference Contribution