Prof. Dr. Heiner Ryssel

Technische Fakultät

Additional peaks in mass spectra due to charge exchange events and dissociation of molecular ions during extraction (2005) Häublein V, Frey L, Ryssel H Journal article, Original article Design, fabrication and characterization of a microactuator for nebulization of fluids (2004) Yasenov NN, Berberich SE, Frey L, Ryssel H Conference contribution Electrical characterization and reliability aspects of zirconium silicate films obtained from novel MOCVD precursors (2004) Lemberger M, Paskaleva A, Zürcher S, Bauer A, Frey L, Ryssel H Journal article, Original article Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams (2004) Lehrer C, Frey L, Petersen S, Ryssel H, Schäfer M, Sulzbach T Journal article, Original article Optical Characterization of Ferroelectric Strontium-Bismut-Tantalate (SBT) Thin Films (2004) Schmidt C, Petrik P, Schneider C, Fried M, Löhner T, Bársony I, Gyulai J, Ryssel H Journal article Modeling of the influence of Schottky barrier inhomogeneities on SiC diode characteristics (2004) Weiss R, Frey L, Ryssel H Authored book, Volume of book series Investigation of rapid thermal annealed pn-junctions in SiC (2004) Frey L, Rambach M, Weiss R, Bauer A, Ryssel H Authored book, Volume of book series Trench sidewall doping for lateral power devices (2003) Berberich SE, Bauer A, Frey L, Ryssel H Conference contribution, Conference Contribution Nanoscale effects in focused ion beam processing (2003) Frey L, Lehrer C, Ryssel H Journal article, Review article Development of enhanced depth-resolution technique for shallow dopant profiles (2002) Fujita M, Tajima J, Nakagawa T, Abo S, Kinomura A, Pászti F, Takai M, et al. Journal article, Original article