Machine Learning for CT-Detector Production

Third party funded individual grant


Start date : 01.04.2022


Project details

Scientific Abstract

The main goal of this project is to improve the detector manufacturing for computer tomography (CT). Therefore, data is gathered during the production of a CT-detector. This data is analysed and used to develop and train a machine learning system which should find the best composition of a CT-detector. In the future, the system will be integrated into the process of CT-detector manufacturing which, in result, should further improve the image quality and the production process of CT-devices. Especially, the warehouse utilization and the first-pass-yield should be enhaced. The project is realized in cooperation with Siemens Healthineers Frochheim.

Involved:

Contributing FAU Organisations:

Funding Source

Research Areas