Thermal stability of Pt films on TiO2(110): evidence for encapsulation
Pesty F, Steinrück HP, Madey TE (1995)
Publication Type: Journal article, Original article
Publication year: 1995
Journal
Original Authors: Pesty F., Steinrück H.-P., Madey T.E.
Publisher: Elsevier
Book Volume: 339
Pages Range: 83-95
DOI: 10.1016/0039-6028(95)00605-2
Abstract
We have studied the thermal stability of ultrathin platinum films on a rutile TiO(110) surface, using low energy ion scattering (LEIS) and X-ray photoelectron spectroscopy (XPS). At room temperature, Pt grows in three-dimensional islands on the TiO surface, with little indication of an interface reaction. Upon annealing to temperatures above 450 K in UHV, encapsulation of the Pt islands by Ti suboxides is observed; the rate of this process increases with annealing temperature and decreases with island thickness. The Ti layer on top of the Pt islands is identified as a reduced Ti species (1 ≤ n ≤ 3) with the degree of reduction depending on the thickness of the Pt islands. These results are discussed in the framework of the strong metal-support interaction (SMSI) effect. © 1995.
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APA:
Pesty, F., Steinrück, H.-P., & Madey, T.E. (1995). Thermal stability of Pt films on TiO2(110): evidence for encapsulation. Surface Science, 339, 83-95. https://doi.org/10.1016/0039-6028(95)00605-2
MLA:
Pesty, François, Hans-Peter Steinrück, and Theodore E. Madey. "Thermal stability of Pt films on TiO2(110): evidence for encapsulation." Surface Science 339 (1995): 83-95.
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