Nondestructive testing of SAW devices by laser probing

Holm A, Russer P, Ruile W, Weigel R (1997)

Publication Type: Conference contribution

Publication year: 1997

Pages Range: 177-181

Conference Proceedings Title: Procceedings of the 9th Microwave and Optronics Conference (MIOP 1997)

Event location: Sindelfingen, Germany

ISBN: 978-3-924651-53-4

Authors with CRIS profile

Robert Weigel Lehrstuhl für Technische Elektronik (LTE)

Involved external institutions

Technische Universität München (TUM) DE Germany (DE)

How to cite

APA:

Holm, A., Russer, P., Ruile, W., & Weigel, R. (1997). Nondestructive testing of SAW devices by laser probing. In Procceedings of the 9th Microwave and Optronics Conference (MIOP 1997) (pp. 177-181). Sindelfingen, Germany.

MLA:

Holm, Andreas, et al. "Nondestructive testing of SAW devices by laser probing." Proceedings of the Procceedings of the 9th Microwave and Optronics Conference (MIOP 1997), Sindelfingen, Germany 1997. 177-181.

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