A robust similarity measure for nonrigid image registration with outliers

Pszczolkowski S, Zafeiriou S, Ledig C, Rueckert D (2014)

Publication Type: Conference contribution

Publication year: 2014

Publisher: Institute of Electrical and Electronics Engineers Inc.

Pages Range: 568-571

Conference Proceedings Title: 2014 IEEE 11th International Symposium on Biomedical Imaging, ISBI 2014

Event location: Beijing, CHN

ISBN: 9781467319591

DOI: 10.1109/isbi.2014.6867934

Abstract

Nonrigid image registration is a widely used technique in medical imaging. While most methods work very well on images without pathologies or artefacts, there is a high need for improved robustness on images from pathological subjects and acquisitions with artefacts such as intensity inhomogeneity. In this paper, we propose a novel similarity measure based on normalised gradients for nonrigid registration, which is robust on images with intensity inhomogeneities or pathologies. We provide both theoretical and experimental proof of the robustness and evaluate the approach on manually segmented and simulated pathological images. Compared to normalised mutual information and to an alternative similarity also based on normalised gradients, we obtain significant overlap improvements for images with intensity inhomogeneities. We further confirm improved robustness on images with simulated tumours.

Involved external institutions

Imperial College London / The Imperial College of Science, Technology and Medicine GB United Kingdom (GB)

How to cite

APA:

Pszczolkowski, S., Zafeiriou, S., Ledig, C., & Rueckert, D. (2014). A robust similarity measure for nonrigid image registration with outliers. In 2014 IEEE 11th International Symposium on Biomedical Imaging, ISBI 2014 (pp. 568-571). Beijing, CHN: Institute of Electrical and Electronics Engineers Inc..

MLA:

Pszczolkowski, Stefan, et al. "A robust similarity measure for nonrigid image registration with outliers." Proceedings of the 2014 IEEE 11th International Symposium on Biomedical Imaging, ISBI 2014, Beijing, CHN Institute of Electrical and Electronics Engineers Inc., 2014. 568-571.

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