A Method for the Accumulation of Forward-Looking SAR Images in Automotive Applications

Reinecke M, Noegel T, Heidbrink M, Sura O, Hoffmann M, Gulden P, Vossiek M (2024)


Publication Type: Conference contribution

Publication year: 2024

Publisher: IEEE

City/Town: New York City

Pages Range: 280-283

Conference Proceedings Title: 2024 21st European Radar Conference (EuRAD)

Event location: Paris FR

DOI: 10.23919/EuRAD61604.2024.10734956

Abstract

In the automotive domain, Forward-Looking Synthetic Aperture Radar (FL-SAR) systems can provide environmental perception, overcoming visibility limitations and integration constraints. However, synthesizing high-resolution cumulative maps from individual FL-SAR snapshots can be challenging, because varying target angles and, thus, angular resolutions between snapshots have to be considered. The presented method addresses this challenge by dynamically weighting and accumulating multiple snapshots, enabling the trade-off between prioritizing measurements with higher resolutions and obscurity issues. Our approach rectifies resolution inconsistencies inherent in FL-SAR systems, enhancing the quality of cumulative maps. We provide an overview of FL-SAR measurements and achievable resolution gains compared to static imaging methods. Our measurement results demonstrate the effectiveness of the algorithm in generating seamless maps, which was validated in real-world scenarios. This research aims to advance the role of FL-SAR as a reliable tool for environmental perception and mapping in automotive applications.

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How to cite

APA:

Reinecke, M., Noegel, T., Heidbrink, M., Sura, O., Hoffmann, M., Gulden, P., & Vossiek, M. (2024). A Method for the Accumulation of Forward-Looking SAR Images in Automotive Applications. In 2024 21st European Radar Conference (EuRAD) (pp. 280-283). Paris, FR: New York City: IEEE.

MLA:

Reinecke, Marc, et al. "A Method for the Accumulation of Forward-Looking SAR Images in Automotive Applications." Proceedings of the 2024 21st European Radar Conference (EuRAD), Paris New York City: IEEE, 2024. 280-283.

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