Modifying the Complex Refractive Index of Thin-Films for Nanooptical Applications

Kunne M, Kusserow T, Witzigmann B, Hillmer H (2024)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2024

Publisher: IEEE Computer Society

Conference Proceedings Title: 2024 International Conference on Optical MEMS and Nanophotonics (OMN)

Event location: San Sebastian ES

ISBN: 9798350384925

DOI: 10.1109/OMN61224.2024.10685281

Abstract

We present a method to generate 2D refractive index patterns in thin-films for nanooptical applications, like metasurfaces and plasmonics. The method is based on standard deposition, lithography and manipulation processes and can be applied to numerous material systems. Examples for modification of indium tin oxide and transition metal nitride layers are given.

Authors with CRIS profile

Thomas Kusserow Lehrstuhl für Optoelektronik Bernd Witzigmann Lehrstuhl für Optoelektronik

Involved external institutions

Universität Kassel DE Germany (DE)

How to cite

APA:

Kunne, M., Kusserow, T., Witzigmann, B., & Hillmer, H. (2024). Modifying the Complex Refractive Index of Thin-Films for Nanooptical Applications. In 2024 International Conference on Optical MEMS and Nanophotonics (OMN). San Sebastian, ES: IEEE Computer Society.

MLA:

Kunne, Marco, et al. "Modifying the Complex Refractive Index of Thin-Films for Nanooptical Applications." Proceedings of the 2024 International Conference on Optical MEMS and Nanophotonics, OMN 2024, San Sebastian IEEE Computer Society, 2024.

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