Cvecek K, Schmidt M
Publication Type: Journal article
Book Volume: 20
Pages Range: 204-211
Journal Issue: 3
DOI: 10.2961/jlmn.2025.03.2005
We present a high-resolution spectroscopic characterization of the frequency-doubled output (532 nm) of an industrial-grade picosecond Nd:YAG laser. A Michelson interferometer with a PID-controlled linear stage was used to provide the path delay change during taking the interferogram, despite its non-uniform motion which in general prohibits direct Fourier-based spectral reconstruction. We introduce a correction scheme combining inverse FFT artefact suppression and a matched-filter approach to recover the true spectral content with sub-nanometer accuracy. The most probable emission peak was determined at 531.844 nm with a FWHM of 0.0437 nm, in good agreement with literature values for Nd:YAG fluorescence peaks. Our method enables precise spectral measurements, without resorting to phase-stabilized scanning methods or calibrated spectrometers.
APA:
Cvecek, K., & Schmidt, M. (2025). High-convenience Interferometric Measurement of the Spectrum of a Picosecond Industrial-grade Nd:YAG Laser Using a PID Linear Drive. Journal of Laser Micro Nanoengineering, 20(3), 204-211. https://doi.org/10.2961/jlmn.2025.03.2005
MLA:
Cvecek, Kristian, and Michael Schmidt. "High-convenience Interferometric Measurement of the Spectrum of a Picosecond Industrial-grade Nd:YAG Laser Using a PID Linear Drive." Journal of Laser Micro Nanoengineering 20.3 (2025): 204-211.
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