B Nanoelectronic Materials

Self-assembly of supramolecular architectures and polymers by orthogonal metal complexation and hydrogen-bonding motifs (2011) Grimm F, Ulm N, Gröhn F, Düring J, Hirsch A Journal article, Original article Low-Voltage p- and n-Type Organic Self-Assembled Monolayer Field Effect Transistors (2011) Novak M, Ebel A, Meyer-Friedrichsen T, Jedaa A, Vieweg B, Yang G, Voitchovsky K, et al. Journal article, Report Density gradient ultracentrifugation on carbon nanotubes according to structural integrity as a foundation for an absolute purity evaluation (2011) Backes C, Bosch S, Mundloch U, Hauke F, Hirsch A, Hauke F Journal article, Original article Counterion effect on the aggregation of anionic perylene dyes and the influence on carbon nanotube dispersion efficiencies (2011) Backes C, Schunk T, Hauke F, Hirsch A Journal article, Original article Gate oxide reliability at the nanoscale evaluated by combining conductive atomic force microscopy and constant voltage stress (2011) Erlbacher T, Yanev VC, Rommel M, Bauer A, Frey L Journal article Dopant profiles in silicon created by MeV hydrogen implantation: Influence of annealing parameters (2011) Laven J, Hans Joachim S, Häublein V, Niedernostheide FJ, Ryssel H, Frey L Journal article Morphological impact of zinc oxide layers on the device performance in thin-film transistors (2011) Faber H, Klaumünzer M, Voigt M, Galli D, Vieweg B, Peukert W, Spiecker E, Halik M Journal article, Report Properties of SiO2 and Si3 N4 as gate dielectrics for printed ZnO transistors (2011) Walther S, Polster S, Meyer B, Jank MPM, Ryssel H, Frey L Journal article, Original article Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy (2011) Jambreck JD, Yanev V, Schmitt H, Rommel M, Bauer AJ, Frey L Journal article, Original article Leakage current and defect characterization of p+n-source/drain diodes (2011) Roll G, Goldbach M, Frey L Journal article, Original article