Lehrstuhl für Elektronische Bauelemente

Capsule-based combinatorial study of solubility, transport and crystallization for ammonothermal synthesis of piezoelectric and ferroelectric ternary nitrides (2026) Geng C, Wostatek T, Zenk M, Friedrich J, Schimmel S Conference contribution, Abstract of lecture Development of a Diagnostic Tool for Elbow Instability Combining 4D-CT Imaging and Mechanical Load Analysis (2026) Gehring J, Forster F, Meindl M, März M, Simon M, Renner N, Uder M, et al. Journal article Low-Temperature Characterization of Sheet and Contact Resistance in 4H-SiC Test Structures from 300 K to 4 K (2026) Hobbacher E, Magerl F, Pixius C, Förthner J, May A, Rommel M, Schulze J Conference contribution Interface Design and Optimization of Anode Catalyst Utilization in Water Electrolysis: Tomography-Based Modeling (2026) Ma TC, Hutzler A, Bierling M, Schwarz J, Hanke-Rauschenbach R, Thiele S Journal article In Situ Coating Thickness Measurement of Parylene Using a Capacitive Sensor (2026) Seidenath M, Jäger D, Wilhelm J, Rauh H, März M Journal article Experimental method and thermodynamic concept for investigating and rationalizing oxygen gettering by ammonothermal reactor walls (2026) Wostatek T, Tian L, Wei Y, Neumeier S, Schimmel S Conference contribution, Abstract of a poster Impact of Surface Treatment on Noise in PL Measurements of Silicon Vacancies in 4H-SiC Lateral PIN-Diodes (2026) Schwarberg J, Magerl F, Beuer S, May A, Gobert C, Siebert M, Miersch C, et al. Journal article, Letter Towards a Fully Integrated 4H-SiC A-Plane Quantum-Chip – Transistors and Light Emitters (2026) Schwarberg J, Dick J, May A, Michałowski P, Kallinger B, Kammel R, Rommel M, Schulze J Journal article Correction: Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes (Scientific Reports, (2025), 15, 1, (39578), 10.1038/s41598-025-25338-0) (2026) Kinstler A, Neumann R, Taylor AA, Besendörfer S, Meißner E, Weingärtner R, Brunner F, et al. Journal article, Erratum Scalable Fabrication and Electrical Characterization of Lateral pin-Diodes on 4H-SiC a-Plane Wafers for Functionalization of Silicon Vacancies (2026) Schwarberg J, Gobert C, Hrunski F, May A, Knolle W, Kallinger B, Schmid F, et al. Journal article